IEEE - Institute of Electrical and Electronics Engineers, Inc. - Visualizing Material Quality and Similarity of mc-Si Wafers Learned by Convolutional Regression Networks

Author(s): Matthias Demant ; Patrick Virtue ; Aditya Kovvali ; Stella X. Yu ; Stefan Rein
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2019
Volume: 9
Page(s): 1,073 - 1,080
ISSN (Electronic): 2156-3403
ISSN (Paper): 2156-3381
DOI: 10.1109/JPHOTOV.2019.2906037
Regular:

Convolutional neural networks can be trained to assess the material quality of multicrystalline silicon wafers. A successful rating model has been presented in a related work, which directly... View More

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