IEEE - Institute of Electrical and Electronics Engineers, Inc. - Forensic Similarity for Digital Images

Author(s): Owen Mayer ; Matthew C. Stamm
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1556-6021
ISSN (Paper): 1556-6013
DOI: 10.1109/TIFS.2019.2924552
Regular:

In this paper we introduce a new digital image forensics approach called forensic similarity, which determines whether two image patches contain the same forensic trace or different forensic... View More

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