IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spectrum Analyzer-Based Phase Measurement for Near-Field EMI Scanning

Author(s): Shubhankar Marathe ; Zongyi Chen ; Kaustav Ghosh ; Hamed Kajbaf ; Stephan Frei ; Morten Sorensen ; David Pommerenke ; Jin Min
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 11
ISSN (Electronic): 1558-187X
ISSN (Paper): 0018-9375
DOI: 10.1109/TEMC.2019.2920344
Regular:

Often, electromagnetic interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and far-field predictions. Magnitude... View More

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