IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of a Time-of-flight Electronics System for Neutron Beam Profiling at CSNS-WNS

Author(s): Haolei Chen ; Changqing Feng ; Jiadong Hu ; Laifu Luo ; Li Wang ; Zhixin Tan ; Shubin Liu
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2019.2924640
Regular:

A 256-channel time-of-flight electronics system has been developed for a facility called "Back-n WNS" in China Spallation Neutron Source (CSNS). This paper presents the structure and performance... View More

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