IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simple and Affordable Method for Fast Transient Measurements of SiC Devices

Author(s): David Garrido ; Igor Baraia ; Joseba Arza ; Manex Barrenetxea
Sponsor(s): IEEE Power Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0107
ISSN (Paper): 0885-8993
DOI: 10.1109/TPEL.2019.2924358
Regular:

The measurement of fast voltage and current transients of SiC devices requires high bandwidth probes. Commercially available voltage and current probes can be expensive and in addition, the delay... View More

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