IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Chip-Scale Plasmonic Spectrometer for In Situ Characterization of Solar System Surfaces

2019 IEEE Aerospace Conference

Author(s): Nancy Chanover ; Sang-Yeon Cho ; David Voelz ; Charles Pelzman ; Hanyu Zhan ; Matthew Varakian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2019
Conference Location: Big Sky, MT, USA, USA
Conference Date: 2 March 2019
Page(s): 1 - 7
ISBN (Electronic): 978-1-5386-6854-2
DOI: 10.1109/AERO.2019.8741932
Regular:

We discuss the development of a plasmonic spectrometer for in situ characterization of solar system surface and subsurface environments. The two goals of this effort are to (1) quantitatively... View More

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