IEEE - Institute of Electrical and Electronics Engineers, Inc. - Level Measurement in Grain Silos with Extreme Learning Machine Algorithm

2019 Scientific Meeting on Electrical-Electronics & Biomedical Engineering and Computer Science (EBBT)

Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2019
Conference Location: Istanbul, Turkey, Turkey
Conference Date: 24 April 2019
Page(s): 1 - 4
ISBN (Electronic): 978-1-7281-1013-4
DOI: 10.1109/EBBT.2019.8742047
Regular:

In this study, a new method based on a machine learning technique to detect the amount of grain in silos with radar is proposed. In order to carry out the measurements in the laboratory... View More

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