IEEE - Institute of Electrical and Electronics Engineers, Inc. - Event-Driven Model for High Speed End-to-End Simulations of Transmission System with Non-Linear Optical Elements and Cascaded Clock-and-Data Recovery Circuits

2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

Author(s): Jun Matsui ; Hisakatsu Yamaguchi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2019
Conference Location: Hsinchu, Taiwan, Taiwan
Conference Date: 22 April 2019
Page(s): 1 - 4
ISBN (Electronic): 978-1-7281-0655-7
ISSN (Electronic): 2472-9124
DOI: 10.1109/VLSI-DAT.2019.8742030
Regular:

We describe a new end-to-end model for simulating high-speed transmission systems with electrical-to-optical and optical-to-electrical converters and the accompanying clock-and-data... View More

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