IEEE - Institute of Electrical and Electronics Engineers, Inc. - Support Vector Machine Based Method for Automatic Detection of Diabetic Eye Disease using Thermal Images

2019 1st International Conference on Innovations in Information and Communication Technology (ICIICT)

Author(s): D. Selvathi ; K. Suganya
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2019
Conference Location: CHENNAI, India, India
Conference Date: 25 April 2019
Page(s): 1 - 6
ISBN (CD): 978-1-7281-1603-7
ISBN (Electronic): 978-1-7281-1604-4
DOI: 10.1109/ICIICT1.2019.8741450
Regular:

Diabetic eye disease is one of the major problems worldwide. That can cause major impairment to the eyes, including a permanent loss of vision. Early detection of eye diseases increase the... View More

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