IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Evaluation on the Robustness of Five Popular Keypoint Descriptors to Image Modifications Specific to Laser Scanning Microscopy

Author(s): Devrim Unay ; Stefan G. Stanciu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2018
Volume: 6
Page(s): 40,154 - 40,164
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2855264
Regular:

Laser scanning microscopy (LSM) techniques are of paramount importance at this time for key domains such as biology, medicine, or materials science. Computer vision methods are instrumental for... View More

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