IEEE - Institute of Electrical and Electronics Engineers, Inc. - A critical re-examination on conduction processes in gas-insulated DC devices at low electric fields

Author(s): Malte Tschentscher ; Christian M. Franck
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 25
Page(s): 1,177 - 1,185
ISSN (Electronic): 1558-4135
ISSN (Paper): 1070-9878
DOI: 10.1109/TDEI.2018.007259
Regular:

The established theories behind low-field ion-drift currents assume that the charge generation from natural ionization is the main source of the charge-carriers, and that it defines the current... View More

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