IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cross Point Test Arrays for Development and Yield Ramp of Emerging Memories

2019 Electron Devices Technology and Manufacturing Conference (EDTM)

Author(s): Tomasz Brozek ; Dennis Ciplickas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2019
Conference Location: Singapore, Singapore, Singapore
Conference Date: 12 March 2019
Page(s): 291 - 293
ISBN (Electronic): 978-1-5386-6508-4
DOI: 10.1109/EDTM.2019.8731138
Regular:

New non-volatile memory types are becoming increasingly attractive for embedded and storage-class applications. Among the development challenges to insert memory elements between upper... View More

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