IEEE - Institute of Electrical and Electronics Engineers, Inc. - Process Variation of Pixel Definition and Effects of Flexible OLED Luminance Degradation

2019 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Jongwon Lee ; Sangkil Kim ; Yoonsuk Choi ; Jongwoo Park
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2019
Conference Location: Monterey, CA, USA, USA
Conference Date: 31 March 2019
Page(s): 1 - 6
ISBN (Electronic): 978-1-5386-9504-3
ISSN (Electronic): 1938-1891
DOI: 10.1109/IRPS.2019.8720529
Regular:

We focus on the effects of process variation of the pixel definition layer (PDL) on luminance degradation following a 2-parameter stretched exponential decay (SED) model. It is found that when the... View More

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