IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling

2019 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Zhicheng Wu ; Jacopo Franco ; Dieter Claes ; Gerhard Rzepa ; Philippe J. Roussel ; Nadine Collaert ; Guido Groeseneken ; Dimitri Linten ; Tibor Grasser ; Ben Kaczer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2019
Conference Location: Monterey, CA, USA, USA
Conference Date: 31 March 2019
Page(s): 1 - 7
ISBN (Electronic): 978-1-5386-9504-3
ISSN (Electronic): 1938-1891
DOI: 10.1109/IRPS.2019.8720541
Regular:

A new gate pattern is proposed to minimize test time while maximizing charge capture and emission into/from oxide defects for efficient and accurate BTI modeling. In conjunction with the imec/T.U.... View More

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