IEEE - Institute of Electrical and Electronics Engineers, Inc. - Novel Cumulative Degradation Approach to Predict Components Failure Rates

2019 IEEE International Reliability Physics Symposium (IRPS)

Author(s): George Thiel ; Flavio Griggio
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2019
Conference Location: Monterey, CA, USA, USA
Conference Date: 31 March 2019
Page(s): 1 - 7
ISBN (Electronic): 978-1-5386-9504-3
ISSN (Electronic): 1938-1891
DOI: 10.1109/IRPS.2019.8720495
Regular:

This paper describes a novel approach for predicting failure rates for components and hardware systems. A physics-of-failure-based methodology is provided to predict the degradation rate of... View More

Advertisement