IEEE - Institute of Electrical and Electronics Engineers, Inc. - Product Reliability Methods to Enable High Performance CPU's

2019 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Roman Rechter ; Robert Kwasnick ; Almog Reshef ; Oren Zonensain ; Tal Raz ; Anisur Rahman ; Praveen Polasam ; Maxim Levit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2019
Conference Location: Monterey, CA, USA, USA
Conference Date: 31 March 2019
Page(s): 1 - 5
ISBN (Electronic): 978-1-5386-9504-3
ISSN (Electronic): 1938-1891
DOI: 10.1109/IRPS.2019.8720500
Regular:

Over the past several years, Intel released five generations of Core™ processors with increasing performance. Some performance improvements are due to transistor and process enhancements.... View More

Advertisement