IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transformation of Ramped Current Stress V BD to Constant Voltage Stress TDDB T BD

2019 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Andrew Kim ; Ernest Wu ; Baozhen Li ; Barry Linder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2019
Conference Location: Monterey, CA, USA, USA
Conference Date: 31 March 2019
Page(s): 1 - 5
ISBN (Electronic): 978-1-5386-9504-3
ISSN (Electronic): 1938-1891
DOI: 10.1109/IRPS.2019.8720572
Regular:

We have carried out an investigation for equivalence among three different stress methods: ramped voltage stress (RVS) method, ramped current stress (RCS) method, and constant voltage stress (CVS)... View More

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