IEEE - Institute of Electrical and Electronics Engineers, Inc. - Addressing a New Class of Reliability Threats in 3-Dimensional Network-on-Chips

Author(s): Ebadollah Taheri ; Mihailo Isakov ; Ahmad Patooghy ; Michel A Kinsy
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1937-4151
ISSN (Paper): 0278-0070
DOI: 10.1109/TCAD.2019.2917846
Regular:

Network-on-Chips (NoCs) are vulnerable to transient and permanent faults caused by thermal violations, aging effects, component wear out, or even transient fault sources. Although some of these... View More

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