IEEE - Institute of Electrical and Electronics Engineers, Inc. - Recovery of inter-crystal compton scattering events for sensitivity improvement of sub-250 ps TOF-PET detector

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Author(s): Geng Fu ; Adrian Ivan ; Hua Qian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Strasbourg, France
Conference Date: 29 October 2016
Page(s): 1 - 5
ISBN (Electronic): 978-1-5090-1642-6
DOI: 10.1109/NSSMIC.2016.8069520
Regular:

In PET detector designs, high sensitivity is a critical performance parameter required for obtaining images with reasonable signal-to-noise ratio (SNR). The sensitivity of a PET scanner is... View More

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