IEEE - Institute of Electrical and Electronics Engineers, Inc. - Time-over-threshold for pulse shape discrimination in a time-of-flight/depth of interaction phoswich PET detector

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Author(s): Chen-Ming Chang ; Joshua W. Cates ; Craig S. Levin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Strasbourg, France
Conference Date: 29 October 2016
Page(s): 1 - 3
ISBN (Electronic): 978-1-5090-1642-6
DOI: 10.1109/NSSMIC.2016.8069443
Regular:

We are developing a PET detector capable of measuring both time-of-fight (TOF) and depth-of-interaction (DOI) with a goal to improve resulting image quality and accuracy. Phoswich designs... View More

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