IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of a novel DOI detector using laser manufacturing

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Author(s): H. Yamauchi ; H. Uchida ; T. Sakai ; K. Hakamata ; K. Shimizu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Strasbourg, France
Conference Date: 29 October 2016
Page(s): 1 - 4
ISBN (Electronic): 978-1-5090-1642-6
DOI: 10.1109/NSSMIC.2016.8069796
Regular:

A novel single-ended-readout depth-of-interaction (DOI) detector is proposed for application in positron emission tomography (PET). The crystal unit of this detector is formed by a... View More

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