IEEE - Institute of Electrical and Electronics Engineers, Inc. - Timing performance of two PET detector designs capable of time-of-flight and depth-of-interaction measurement: Phoswich and offset crystal layers

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Author(s): Chen-Ming Chang ; Craig S. Levin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Strasbourg, France
Conference Date: 29 October 2016
Page(s): 1 - 3
ISBN (Electronic): 978-1-5090-1642-6
DOI: 10.1109/NSSMIC.2016.8069400
Regular:

PET detectors capable of measuring 511 keV photon time-of-fight (TOF) and depth-of-interaction (DOI) can improve resulting image quality and accuracy. In this work, we studied the timing... View More

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