IEEE - Institute of Electrical and Electronics Engineers, Inc. - MEBCIS: Multi-energy betatron-based cargo inspection system

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Author(s): Anatoli Arodzero ; Salime Boucher ; Sergey V. Kutsaev ; Richard C. Lanza ; Vincent Palermo ; Finn O'Shea ; Vitaliy Ziskin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Strasbourg, France
Conference Date: 29 October 2016
Page(s): 1 - 5
ISBN (Electronic): 978-1-5090-1642-6
DOI: 10.1109/NSSMIC.2016.8069705
Regular:

The security market requirements for state-of-the-art mobile and portal radiography inspection systems include high imaging resolution (better than 5 mm line pair), penetration beyond 300 mm steel... View More

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