IEEE - Institute of Electrical and Electronics Engineers, Inc. - Time-of-Flight detection of Al ions from laser produced plasma

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Author(s): M. Seimetz ; P. Bellido ; A. Peralta Conde ; J. I. Apinaniz ; A. V. Carpentier ; M. Sanchez Albaneda ; F. Valle Brozas ; C. Mendez ; J. Lozano ; J. M. Alvarez ; R. Lera ; A. Ruiz-de la Cruz ; M. Galan ; L. Vidal ; A. Soriano ; S. Sanchez ; F. Sanchez ; M. J. Rodriguez-Alvarez ; J. P. Rigla ; L. Moliner ; A. Iborra ; L. Hernandez ; A. J. Gonzalez ; P. Conde ; A. Aguilar ; L. Roso ; J. M. Benlloch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Strasbourg, France
Conference Date: 29 October 2016
Page(s): 1 - 4
ISBN (Electronic): 978-1-5090-1642-6
DOI: 10.1109/NSSMIC.2016.8069810
Regular:

Background: The interaction of highly intense laser pulses with solid targets covers a wide range of phenomena over several orders of magnitude in laser intensity. Time-of-flight measurements... View More

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