IEEE - Institute of Electrical and Electronics Engineers, Inc. - Geometry optimization of dual-layer offset detectors for compact ring diameter PET systems

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Author(s): Mohammadreza Teimoorisichani ; Andrew L. Goertzen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Strasbourg, France
Conference Date: 29 October 2016
Page(s): 1 - 3
ISBN (Electronic): 978-1-5090-1642-6
DOI: 10.1109/NSSMIC.2016.8069606
Regular:

Compact ring diameter PET systems suffer degradation in spatial resolution with increasing radial offset due to the parallax error caused by depth of interaction (DOI) effects. In this work, we... View More

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