IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiation hardness tests with neutrons of timing counter MEGII SiPMs

2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Author(s): T. Cervi ; S. Bariani ; P. W. Cattaneo ; M. Oddone ; M. C. Prata ; M. Prata ; E. Romano ; M. Rossella ; M. Simonetta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Strasbourg, France
Conference Date: 29 October 2016
Page(s): 1 - 4
ISBN (Electronic): 978-1-5090-1642-6
DOI: 10.1109/NSSMIC.2016.8069763
Regular:

The MEGII Timing Counter will measure the positron time of arrival with a resolution of 30 ps relying on two arrays of scintillator pixels read out by 6144 Silicon Photomultipliers (SiPMs) from... View More

Advertisement