IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extraction of Frequent Sequential Patterns from Sequence at Uneven Intervals

2018 Joint 10th International Conference on Soft Computing and Intelligent Systems (SCIS) and 19th International Symposium on Advanced Intelligent Systems (ISIS)

Author(s): Kenta Morita ; Haruhiko Takase ; Masachika Sawamura ; Naoki Morita ; Hidehiko Kita
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Toyama, Japan, Japan
Conference Date: 5 December 2018
Page(s): 1,437 - 1,441
ISBN (Electronic): 978-1-5386-2633-7
DOI: 10.1109/SCIS-ISIS.2018.00225
Regular:

In this paper, we discuss a method to extract frequent sub-sequences from time series data with variations in intervals of input elements. Several methods for extracting frequent sub-sequences... View More

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