IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Problem Analysis Method in Open Systems Using "Function Chain"

2018 Joint 10th International Conference on Soft Computing and Intelligent Systems (SCIS) and 19th International Symposium on Advanced Intelligent Systems (ISIS)

Author(s): Akio Shinohara ; Hisao Tsujimura ; Takashi Izumi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Toyama, Japan, Japan
Conference Date: 5 December 2018
Page(s): 1,002 - 1,008
ISBN (Electronic): 978-1-5386-2633-7
DOI: 10.1109/SCIS-ISIS.2018.00166
Regular:

We are proposing a new method for identifying a root failure point in open system problems. The analysis of issues often depends on the experience of support engineers and the process tends to be... View More

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