IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Problem Analysis Method in Open Systems Using "Function Chain"
2018 Joint 10th International Conference on Soft Computing and Intelligent Systems (SCIS) and 19th International Symposium on Advanced Intelligent Systems (ISIS)
Author(s): | Akio Shinohara ; Hisao Tsujimura ; Takashi Izumi |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 December 2018 |
Conference Location: | Toyama, Japan, Japan |
Conference Date: | 5 December 2018 |
Page(s): | 1,002 - 1,008 |
ISBN (Electronic): | 978-1-5386-2633-7 |
DOI: | 10.1109/SCIS-ISIS.2018.00166 |
Regular:
We are proposing a new method for identifying a root failure point in open system problems. The analysis of issues often depends on the experience of support engineers and the process tends to be... View More