IEEE - Institute of Electrical and Electronics Engineers, Inc. - Leaf Instance Segmentation and Counting Based on Deep Object Detection and Segmentation Networks

2018 Joint 10th International Conference on Soft Computing and Intelligent Systems (SCIS) and 19th International Symposium on Advanced Intelligent Systems (ISIS)

Author(s): Lele Xu ; Ye Li ; Yuanyuan Sun ; Lei Song ; Shan Jin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Toyama, Japan, Japan
Conference Date: 5 December 2018
Page(s): 180 - 185
ISBN (Electronic): 978-1-5386-2633-7
DOI: 10.1109/SCIS-ISIS.2018.00038
Regular:

Accurately extracting the shape and number of leaves is a hot topic in plant phenotype studies recently. Traditional statistical methods could not handle the problems when very small-shaped leaves... View More

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