IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of F-Transform Based Measures of Image Sharpness

2018 Joint 10th International Conference on Soft Computing and Intelligent Systems (SCIS) and 19th International Symposium on Advanced Intelligent Systems (ISIS)

Author(s): Marek Vajgl ; Irina Perfilieva
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Toyama, Japan, Japan
Conference Date: 5 December 2018
Page(s): 281 - 286
ISBN (Electronic): 978-1-5386-2633-7
DOI: 10.1109/SCIS-ISIS.2018.00057
Regular:

During our research, we have presented a novel approach for multi-focus image fusion based on new image sharpness measures built on F-Transform. We have already presented that F-Transform based... View More

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