IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Detection and Removal of Ineffective Mutants for the Mutation Analysis of Relational Database Schemas

Author(s): Phil McMinn ; Chris J. Wright ; Colton J. McCurdy ; Gregory M. Kapfhammer
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2019
Volume: 45
Page(s): 427 - 463
ISSN (CD): 2326-3881
ISSN (Electronic): 1939-3520
ISSN (Paper): 0098-5589
DOI: 10.1109/TSE.2017.2786286
Regular:

Data is one of an organization's most valuable and strategic assets. Testing the relational database schema, which protects the integrity of this data, is of paramount importance. Mutation... View More

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