IEEE - Institute of Electrical and Electronics Engineers, Inc. - Amending of embedded thermometry method for testing friction temperature rise of braking

Author(s): Zengsong Li ; Jiusheng Bao ; Yan Yin ; Tonggang Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2019
Volume: 22
Page(s): 28 - 35
ISSN (Electronic): 1941-0123
ISSN (Paper): 1094-6969
DOI: 10.1109/MIM.2019.8716273
Regular:

Embedded thermometry is an important method for testing friction temperature rise of braking. However, the friction temperature cannot be sampled from the friction interface directly, which... View More

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