IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of a Nonintrusive True-RMS AC Voltage Measurement Probe

Author(s): Shenil P. S. ; Boby George
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2019.2916959
Regular:

The design and development of a new nonintrusive type True-RMS AC voltage measurement probe is presented in this paper. The measurement circuit of the capacitively coupled nonintrusive voltage... View More

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