IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pulse pileup analysis for a double-sided silicon strip detector using variable pulse shapes

Author(s): Jinghui Wang ; Linchuan Chen ; Mats Persson ; Paurakh L. Rajbhandary ; Praneeth Kandlakunta ; Gabriella Carini ; Rebecca Fahrig
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2019.2917144
Regular:

Due to pulse pileup, photon counting detectors (PCDs) suffer from count loss and energy distortion when operating in high count rate environments. In this paper, we studied the pulse pileup of a... View More

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