IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sparse Voltage Measurement-Based Fault Location Using Intelligent Electronic Devices

Author(s): Ke Jia ; Bin Yang ; Xiongying Dong ; Tao Feng ; Tianshu Bi ; David Thomas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1949-3061
ISSN (Paper): 1949-3053
DOI: 10.1109/TSG.2019.2916819
Regular:

This paper proposes a fault-section location method based on sparse measurements, aimed at asymmetrical faults. A virtual current vector is defined to indicate the faulted section, which is... View More

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