IEEE - Institute of Electrical and Electronics Engineers, Inc. - An equivalent-effect phenomenon in eddy current non-destructive testing of thin structures

Author(s): Wuliang Yin ; Jiawei Tang ; Mingyang Lu ; Hanyang Xu ; Ruochen Huang ; Qian Zhao ; Zhijie Zhang ; Anthony Peyton
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2916980
Regular:

The inductance/impedance due to thin metallic structures in non-destructive testing (NDT) is difficult to evaluate. In particular, in Finite Element Method (FEM) eddy current simulation, an... View More

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