IEEE - Institute of Electrical and Electronics Engineers, Inc. - Predicting Aortic Regurgitation after Transcatheter Aortic Valve Replacement by Finite Element Method

Author(s): Guangming Zhang ; Min Pu ; Yi Gu ; Xiaobo Zhou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2916762
Regular:

Aortic regurgitation as a sever complication of Transcatheter Aortic Valve Replacement (TAVR) is usually due to the aortic valve leaflets carry severity and inhomogeneous distribution of the... View More

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