IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability of high-voltage GaN-based light-emitting diodes

Author(s): Xing Fan ; Weiling Guo ; Jie Sun
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-2574
ISSN (Paper): 1530-4388
DOI: 10.1109/TDMR.2019.2917005
Regular:

Reliability is important in evaluating semiconductor device quality, although reliability measurement and analysis procedures are complicated. A new type of light-emitting diode (LED), GaN... View More

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