IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Competing Aging Effects on SRAM Operating Life Tests

Author(s): Wei-Ting Kary Chien ; Jessica Xuejiao Luo ; Mark Zhang
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-2574
ISSN (Paper): 1530-4388
DOI: 10.1109/TDMR.2019.2916481
Regular:

The Static Random Access Memory (SRAM) is generally used in the technology qualification vehicle (TQV) in the semiconductor industries to, e.g., assess process maturity and reliability risks. It... View More

Advertisement