IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Tripping Criteria in Stability Control Device Adapting to Half-wavelength AC Transmission Line

Author(s): Haibo Xu ; Run Zhang ; Xueming Li ; Yunsong Yan
Sponsor(s): IEEE Power Engineering Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1937-4208
ISSN (Paper): 0885-8977
DOI: 10.1109/TPWRD.2019.2916107
Regular:

Because the long distance and huge distributed capacity of half-wavelength AC transmission lines (HWACT), the fault characteristics of HWACT lines differ a lot from those of conventional lines. In... View More

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