IEEE - Institute of Electrical and Electronics Engineers, Inc. - Wide-field profilometry with enhanced accuracy utilizing differential structured illumination microscopy

Author(s): Zhongye Xie ; Yan Tang ; Xi Liu ; Junbo Liu ; Yu He ; Song Hu
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0174
ISSN (Paper): 1041-1135
DOI: 10.1109/LPT.2019.2916370
Regular:

The conventional structured illumination microscopy (SIM) reconstructs the surface through determining the focal position from the modulation depth response (MDR) using the Gaussian fitting. In... View More

Advertisement