IEEE - Institute of Electrical and Electronics Engineers, Inc. - Picosecond-Scale Terahertz Pulse Characterization With Field-Effect Transistors

Author(s): Stefan Regensburger ; Stephan Winnerl ; J. Michael Klopf ; Hong Lu ; Arthur C. Gossard ; Sascha Preu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2019
Volume: 9
Page(s): 262 - 271
ISSN (Electronic): 2156-3446
ISSN (Paper): 2156-342X
DOI: 10.1109/TTHZ.2019.2903630
Regular:

Precise real-time detection of terahertz (THz) pulses is a key requirement for characterization of pulsed THz sources and nondestructive testing applications. We experimentally evaluate the speed... View More

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