IEEE - Institute of Electrical and Electronics Engineers, Inc. - An End-to-end Steel Surface Defect Detection Approach via Fusing Multiple Hierarchical Features

Author(s): Yu He ; Kechen Song ; Qinggang Meng ; Yunhui Yan
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2019.2915404
Regular:

A complete defect detection task aims to achieve the specific class and precise location of each defect in an image, which makes it still challenging for applying this task in practice. The defect... View More

Advertisement