IEEE - Institute of Electrical and Electronics Engineers, Inc. - Applying Deep Learning Approach to the Far-Field Subwavelength Imaging Based on Near-Field Resonant Metalens at Microwave Frequencies

Author(s): He Ming Yao ; Min Li ; Lijun Jiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2915263
Regular:

In this paper, we utilize the deep learning approach for the subwavelength imaging in far-field, which is realized by the near-field resonant metalens at microwave frequencies. The resonating... View More

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