IEEE - Institute of Electrical and Electronics Engineers, Inc. - Event-Based State Estimation Under the Presence of Multiplicative Measurement Noise

Author(s): Swapna Challagundla ; Shaikshavali Chitraganti ; Samir Aberkane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2475-1456
DOI: 10.1109/LCSYS.2019.2915403
Regular:

An event-based state estimation problem for a discrete-time system when the measurements are corrupted with multiplicative noise is considered in this article. A general event-based sampling is... View More

Advertisement