IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhanced Random Forest with Concurrent Analysis of Static and Dynamic Nodes for Industrial Fault Classification

Author(s): Zheng Chai ; Chunhui Zhao
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0050
ISSN (Paper): 1551-3203
DOI: 10.1109/TII.2019.2915559
Regular:

In recent years, machine learning algorithms have been successfully applied to industrial processes. However, the concurrent analysis of static and dynamic representations has not been... View More

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