IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-Modal Reflection Removal Using Convolutional Neural Networks

Author(s): Jun Sun ; Yakun Chang ; Cheolkon Jung ; Jiawei Feng
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-2361
ISSN (Paper): 1070-9908
DOI: 10.1109/LSP.2019.2915560
Regular:

Although color images are easily interfered by glass, depth images captured by infrared sensors are robust to reflection. In this paper, we propose multi-modal reflection removal using... View More

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