IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning Local Metrics and Influential Regions for Classification

Author(s): Mingzhi Dong ; Yujiang Wang ; Xiaochen Yang ; Jing-Hao Xue
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2160-9292
ISSN (Electronic): 1939-3539
ISSN (Paper): 0162-8828
DOI: 10.1109/TPAMI.2019.2914899
Regular:

The performance of distance-based classifiers heavily depends on the underlying distance metric, so it is valuable to learn a suitable metric from the data. To address the problem of... View More

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