IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dual-mechanism model to describe the slow response of ISFETs

Author(s): Junkai Zhang ; Dan Zhao ; Hui Yang ; Chen Li ; Huaqing Si ; Dongping Wu
Sponsor(s): IEEE Sensors Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2379-9153
ISSN (Electronic): 1558-1748
ISSN (Paper): 1530-437X
DOI: 10.1109/JSEN.2019.2913568
Regular:

It has been known that the slow response of ion-sensitive field-effect-transistors (ISFETs), with tremendous challenges on meeting the requirements of the accuracy and long-term stability,... View More

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