IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application Research of Complexity Approximate Entropy in Trace Examination

2018 11th International Symposium on Computational Intelligence and Design (ISCID)

Author(s): Bingcheng Wang ; Chang Jing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Hangzhou, China, China
Conference Date: 8 December 2018
Volume: 01
Page(s): 302 - 305
ISBN (Electronic): 978-1-5386-8527-3
ISSN (Electronic): 2473-3547
DOI: 10.1109/ISCID.2018.00075
Regular:

In order to inspect and recognize the surface morphological features of traces better and realize the purpose of quantitative inspection of traces, the theory and algorithm of complexity and... View More

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